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The CEP-tag system provides measurement of the Carrier Envelope Phase (CEP) offset of amplified laser pulses at single-shot. It is based upon traditional f-2f interferometry, where the second harmonic of the red edge of an octave-spanning spectrum is spectrally interfered with the blue edge. Detection is based on a photodiode array and the use of Field-Programmable Gate Array (FPGA) electronics enables us to determine the CEP at a rate of 100 kHz.

Key features

Online single-shot CEP measurement and tagging.

Acquisition at up to 100kHz.

Integration with d-scan system for compact footprint

Product

CEP-tag


              

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